2016

• G. Schiavone, J. Murray, S. Smith, M. P. Y. Desmulliez, A. R. Mount, and A. J. Walton, “A wafer mapping technique for residual stress in surface micromachined films,” J. Micromech. Microeng., vol. 26, no. 9, p. 095013, Sep. 2016. DOI:10.1088/0960-1317/26/9/095013
• E. Sirotkin, S. Smith, R. Walker, J. G. Terry, and A. J. Walton, “Test Structures for the Wafer Mapping and Correlation of the Properties of Electroplated Ferromagnetic Alloy Films,” IEEE Transactions on Semiconductor Manufacturing, vol. 29, no. 3, pp. 201–208, 2016. DOI:10.1109/TSM.2016.2583068
• E. O. Blair, D. K. Corrigan, I. Schmueser, J. G. Terry, S. Smith, A. R. Mount, and A. J. Walton, “Test structures to support the development and process verification of microelectrodes for high temperature operation in molten salts,” 2016 International Conference on Microelectronic Test Structures (ICMTS), pp. 158–162, 2016. DOI:10.1109/ICMTS.2016.7476198
• J. Murray, R. Perry, J. G. Terry, S. Smith, A. R. Mount, and A. J. Walton, “Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures,” 2016 International Conference on Microelectronic Test Structures (ICMTS), pp. 178–183, 2016. DOI:10.1109/ICMTS.2016.7476203
• S. Scarfì, S. Smith, A. Tabasnikov, I. Schmüser, E. Blair, A. S. Bunting, A. J. Walton, A. F. Murray, and J. G. Terry, “Test structures for the characterisation of conductive carbon produced from photoresist,” 2016 International Conference on Microelectronic Test Structures (ICMTS), pp. 184–189, 2016. DOI:10.1109/ICMTS.2016.7476204

2015

• A. Buchoux, P. Valluri, S. Smith, A. A. Stokes, P. R. Hoskins, and V. Sboros, “Manufacturing of microcirculation phantoms using rapid prototyping technologies.,” Conf Proc IEEE Eng Med Biol Soc, vol. 2015, pp. 5908–5911, 2015. DOI:10.1109/EMBC.2015.7319736
• V. Novickij, A. Tabasnikov, S. Smith, A. Grainys, and J. Novickij, “Analysis of Planar Circular Interdigitated Electrodes for Electroporation,” IETE Technical Review, vol. 32, no. 3, pp. 196–203, May 2015. DOI:10.1080/02564602.2014.1000982
• W. Gamal, S. Borooah, S. Smith, I. Underwood, V. Srsen, S. Chandran, P. O. Bagnaninchi, and B. Dhillon, “Real-time quantitative monitoring of hiPSC-based model of macular degeneration on Electric Cell-substrate Impedance Sensing microelectrodes.,” Biosens Bioelectron, vol. 71, pp. 445–455, Apr. 2015. DOI:10.1016/j.bios.2015.04.079
• J. Zhou, H. F. Pang, L. Garcia-Gancedo, E. Iborra, M. Clement, M. De Miguel-Ramos, H. Jin, J. K. Luo, S. Smith, S. R. Dong, D. M. Wang, and Y. Q. Fu, “Discrete microfluidics based on aluminum nitride surface acoustic wave devices,” Microfluid Nanofluid, vol. 18, no. 4, pp. 537–548, 2015. DOI:10.1007/s10404-014-1456-1
• Y. Li, J. G. Terry, S. Smith, A. J. Walton, G. McHale, and B. Xu, “Elastic instabilities induced large surface strain sensing structures (EILS),” presented at the 2015 International Conference on Microelectronic Test Structures (ICMTS), Tempe, AZ, USA, 2015, pp. 94–99. DOI:10.1109/ICMTS.2015.7106116
• A. Tabasnikov, A. J. Walton, and S. Smith, “Combined transmission line measurement structures to study thin film resistive sensor fabrication,” presented at the 2015 International Conference on Microelectronic Test Structures (ICMTS), 2015, pp. 175–180. DOI:10.1109/ICMTS.2015.7106136
• E. Sirotkin, S. Smith, R. Walker, J. G. Terry, and A. J. Walton, “Test structures for the wafer mapping and correlation of electrical, mechanical and high frequency magnetic properties of electroplated ferromagnetic alloy films,” ICMTS 2015, pp. 182–187, Mar. 2015. DOI:10.1109/ICMTS.2015.7106137

Previous years to be completed.